intel SSD Toolbox SMART信息

解釋：
03 – Spin Up Time （磁頭加載時(shí)間）
The average time it takes the spindle to spin up. Since an SSD has no moveable
parts, this attribute reports a fixed raw value of zero (0) and a fixed normalized
value of 100. Use the Raw value for this attribute.
（SSD沒(méi)這東西，所以這個(gè)值 固定為0）

04 – Start/Stop Count （開(kāi)始/停止計(jì)數(shù)）
This type of event is not an issue for SSDs. However, hard disk drives can
experience only a finite number of these events and, therefore, must be tracked.
This attribute reports a fixed value of zero (0) and a fixed normalized value of 100.
Use the Raw value for this attribute.
（不知道，反正數(shù)值無(wú)意義）

05 – Re-Allocated Sector Count （重映射扇區(qū)數(shù)）
This attribute shows the number of retired blocks since leaving the factory (also
known as a grown defect count).
The lithography (litho) of your drive determines which count you should use. Refer
to the drive name in the Select a Drive section. A ―1‖ in the twelfth position
indicates a 50nm drive, while a ―2‖ indicates a 34nm. For example in Figure 22:
SSDSA2M160G2GN indicates a 34nm drive.
For 50nm drives, the normalized value has an initial value of 100 but counts up from
1 for every 4 grown defects. The normalized value of this attribute becomes 1 when
there are 4 grown defects; the value is 2 when there are 8 grown defects, etc. See
the following table for details.

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（隨著重映射扇區(qū)數(shù)的增長(zhǎng)而增加【G1，G2不同】）

09 – Power-On Hours Count （通電時(shí)間）
This attribute reports the cumulative number of power-on hours over the life of the
device. Use the Raw value for this attribute.
Note: The On/Off status of the device initiated power management (DIPM) feature affects
the number of hours reported.
If DIPM is turned ―On‖, the recorded value for power-on hours does not include
the time that the device is in a ―slumber‖ state.
If DIPM is turned ―Off‖, the recorded value for power-on hours should match the
clock time, as all three device states are counted: active, idle and slumber.
（累積通電時(shí)間）

0C – Power Cycle Count （通斷電次數(shù)）
This attribute reports the cumulative number of power cycle events (power on/off
cycles) over the life of the device. Use the Raw value for this attribute.
（開(kāi)關(guān)機(jī)的次數(shù)）

C0 – Unsafe Shutdown Count （異常關(guān)機(jī)次數(shù)）
This attribute reports the cumulative number of unsafe (unclean) shutdown events
over the life of the device. An unsafe shutdown occurs whenever the device is
powered off without STANDBY IMMEDIATE being the last command. Use the Raw
value for this attribute.
（非正常斷電后增長(zhǎng)）

E1 – Host Writes （數(shù)據(jù)寫(xiě)入量）
This attribute reports the total number of sectors written by the host system. The
raw value is increased by 1 for every 65,536 sectors written by the host. Use the
Raw value for this attribute.
（SSD數(shù)據(jù)寫(xiě)入量）

E8 – Available Reserved Space （可用預(yù)留空間）
This attribute reports the number of reserve blocks remaining. The attribute value
begins at 100 (64h), which indicates that the reserved space is 100 percent
available. The threshold value for this attribute is 10 percent availability, which
indicates that the drive is close to its end of life. Use the Normalized value for this
attribute.
（這個(gè)算是顆粒壽命，等于低于10%SSD就離躺倒不遠(yuǎn)了）

E9 – Media Wearout Indicator （閃存磨耗指數(shù)）
This attribute reports the number of cycles the NAND media has experienced.
The normalized value declines linearly from 100 to 1 as the average erase cycle
count increases from 0 to the maximum rated cycles.
Once the normalized value reaches 1, the number does not decrease, although it is
likely that significant additional wear can be put on the device. Use the Normalized
value for this attribute.
（如E8上面，等到低于10%，在沒(méi)有預(yù)留可用空間的情況下，跌的可快了呢- -）

B8 – End to End Error Detection Count （端對(duì)端錯(cuò)誤監(jiān)測(cè)數(shù)）
This attribute is only available for 34nm, G2 drives and counts the number of times
errors are encountered during logical block addressing (LBA) tag checks on the data
path within the drive. Use the Normalized value for this attribute.
（LBA映射錯(cuò)誤增長(zhǎng)的數(shù)值？）

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2. SandForce

SandForce 12xx/15xx 主控的SMART定義可以由SFtoolbox查看。點(diǎn)我下載
SandForce的SMART定義在幾次更新固件后做了點(diǎn)小修改，所以固件不同可能有差別。
大致定義的詳細(xì)解釋如下：

ID 屬性 解釋

1 Raw Read Error Rate 底層數(shù)據(jù)讀取出錯(cuò)率

5 Retired Block Count 不可使用的壞塊計(jì)數(shù) （公式比較怪。。這個(gè)值不準(zhǔn)，新固件都為100）

9 Power On Hours Count 累計(jì)加電時(shí)間

12 Power Cycle Count 設(shè)備通電周期

171 Program Fail Count 編程錯(cuò)誤計(jì)數(shù)

172 Erase Fail Count 擦除錯(cuò)誤計(jì)數(shù)

174 Unexpected Power Loss Count 不正常掉電次數(shù)

177 Wear-Range Data 顯示最大磨損塊和最小磨損塊相差的百分比

181 同171定義相同

182 同172定義相同

187 Reported Uncorrectable Errors 不可修復(fù)錯(cuò)誤計(jì)數(shù)

194 顯示溫度的，基本可以忽略（假的）

195 On the Fly Reported Uncorrectable Error Count 實(shí)時(shí)不可修復(fù)錯(cuò)誤計(jì)數(shù)

196 Reallocated Event Count 重映射壞塊計(jì)數(shù)

231 SSD Life left SSD剩余壽命
新盤為100，當(dāng)顯示為10，代表P/E用完了，但是還有備用空間可以替換，顯示0代表盤上數(shù)據(jù)為只讀。

241 lifetime write froms host 來(lái)自主機(jī)的寫(xiě)入數(shù)據(jù)量總數(shù)（64G更新一次）

242 lifetime write froms host 來(lái)自主機(jī)的讀取數(shù)據(jù)量總數(shù)（64G更新一次）

對(duì)于SandForce主控的SMART,我感覺(jué)作為用戶只要密切關(guān)注241,242兩個(gè)值就能知道自己讀寫(xiě)了多少數(shù)據(jù)，關(guān)注231值的變化大致判斷解剩余壽命。

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3. Micron 鎂光

C300作為首款SATA 6Gbps的SSD主控，主控型號(hào)為Marvell 88SS9174-BJP2，固件由鎂光開(kāi)發(fā)。
目前還沒(méi)有自家的Toolbox，SMART定義大致如下：（可能會(huì)變化）

ID 屬性 解釋

1 Raw Read Error Rate 底層數(shù)據(jù)讀取出錯(cuò)率

5 Re-allocated Sectors Count 使用中新增的壞塊數(shù)

9 Power On Hours Count 累計(jì)加電時(shí)間

12 Power Cycle Count 設(shè)備通電周期

170 Grown Failing Block Count 替換壞塊計(jì)數(shù)

171 Program Fail Count 編程錯(cuò)誤計(jì)數(shù)

172 Erase Fail Count 擦除錯(cuò)誤計(jì)數(shù)

173 Wear Leveling Count 平均擦寫(xiě)次數(shù)

174 Unexpected Power Loss Count 不正常掉電次數(shù)

181 Non-4k Aligned Access 非4KB對(duì)齊訪問(wèn)數(shù)

183 SATA Interface Downshift 接口降級(jí)次數(shù)計(jì)數(shù)

187 Reported Uncorrectable Errors 不可修復(fù)錯(cuò)誤計(jì)數(shù)

188 Command Timeout 指令超時(shí)計(jì)數(shù)

189 Factory Bad Block Count 出廠壞塊計(jì)數(shù)

196 Re-allocation Event Count 壞塊重映射事件計(jì)數(shù)

197 Current Pending Sector Count 值永遠(yuǎn)為0

198 Smart Off-line Scan Uncorrectable Error Count 自檢時(shí)發(fā)現(xiàn)的不可修復(fù)錯(cuò)誤

199 Ultra DMA CRC Error Rate 主機(jī)到接口之間傳輸CRC錯(cuò)誤率

202 Percentage Of The Rated Lifetime Used 剩余壽命（MLC 5000 / SLC 100000計(jì)算)
百分比從100開(kāi)始跌

206 Write Error Rate 底層數(shù)據(jù)寫(xiě)入出錯(cuò)率

我覺(jué)得最主要的是那個(gè)173/AD的值，那個(gè)值是平均塊擦寫(xiě)次數(shù)，用戶可以靠它判斷自己的盤剩余壽命。

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4. Indilinx

著名的韓國(guó)主控廠牌，主控特點(diǎn)為有著優(yōu)秀的連續(xù)讀寫(xiě)，家族有Barefoot, Barefoot Eco和Amigos.
Smart定義可以用官方工具查看。
大致定義的詳細(xì)解釋如下：

ID 屬性 解釋

1 Raw Read Error Rate 底層數(shù)據(jù)讀取出錯(cuò)率

9 Power On Hours Count 累計(jì)加電時(shí)間

12 Power Cycle Count 設(shè)備通電周期

184 Init Bad Block Count 壞塊數(shù)

195 Program Failure block Count 編程錯(cuò)誤塊計(jì)數(shù)

196 Erase Failure block Count 擦除錯(cuò)誤塊計(jì)數(shù)

197 Read Failure block Count 讀取錯(cuò)誤塊計(jì)數(shù)（不可修復(fù)錯(cuò)誤）

198 Total Count of Read Sectors 總讀取頁(yè)數(shù)

199 Total Count of Write Sectors 總寫(xiě)入頁(yè)數(shù)

200 Total Count of Read Command 總讀取指令數(shù)

200 Total Count of Write Command 總寫(xiě)入指令數(shù)

202 Total Count of error bits from flash 總閃存錯(cuò)誤bit數(shù)

203 Total Count of Read Sectors with correct bits error 總修復(fù)bit錯(cuò)誤的讀取頁(yè)數(shù)字

204 BAD Block Full Flag

205 Max P/E Count 最大可編程/擦除次數(shù) MLC 5000/10000 or SLC 100000

206 Erase Count Min 最小擦寫(xiě)次數(shù)

207 Erase Count Max 最大擦寫(xiě)次數(shù)

208 Erase Count Average 平均擦寫(xiě)次數(shù)

209 Remaining Life % 剩余壽命百分比

210 BBM Error Log 壞塊管理錯(cuò)誤日志

211 SATA Error Count CRC (Write) SATA 主機(jī) <->接口CRC寫(xiě)入錯(cuò)誤計(jì)數(shù)

212 SATA Error Count HANDSHAKE (Read) SATA 主機(jī) <->接口讀取錯(cuò)誤計(jì)數(shù)

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